Analyte | Unit | Certified value | Confidence interval (95%) |
No. of independent repeated series |
Measuring method* |
Si |
% |
0.22 |
0.02 |
4 |
1 |
Cu |
% |
76.82 |
0.27 |
3 |
1 |
* Measuring method | |
1: X-ray fluorescence spectrometry |
  |