Analyte | Unit | Certified value | Confidence interval (95%) |
No. of independent repeated series |
Measuring method* |
Si |
% |
0.220 |
0.031 |
3 |
1 |
Cu |
% |
77.00 |
0.07 |
3 |
1 |
* Measuring method | |
1: X-ray fluorescence spectrometry |
  |